Influence of Li Doping in NiO Thin Films Prepared by Simple Chemical Method

Abstract

This study deals with the study of the structural and visual properties of NiO and Li Doped NiO films in different percentages (0.02, 0.04, 0.06, 0.08% mol).Thin films of NiO were deposited on glass substrates at 300 ° C and 150 nm using droplet casting technique. X-ray diffraction (XRD) showed that multi-crystalline films had a cube structure with a preferred orientation along the length of (111). The tonic stimulator did not change between 0.02, 0.04, 0.06 and 0.08% Grammy% of the preferred trend. The average grain sizes of crystals classified from XRD data were found in the range of 15.62 - 37.52 nm. Atomic Force Microscope (AFM) data shows that the film surface is extremely smooth. The photovoltaic permeability of pure NiO membranes is 72% in the visual and x-ray regions (NIR), which is important for their applications as window layers in solar cells.

Keywords: Nickel oxide, XRD, AFM, grain sizes, thin film.